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Improved field emission stability from single-walled carbon nanotubes chemically attached to silicon
- Shearer, Cameron J., Fahy, Adam, Barr, Matthew, Dastoor, Paul C., Shapter, Joseph G.
Scanning probe microscopy for silicon device fabrication
- Simmons, M. Y., Ruess, F. J., Reusch, T. C. G., Goh, K. E. J., Hallam, T., Schofield, S. R., Oberbeck, L., Curson, N. J., Hamilton, A. R., Butcher, M. J., Clark, R. G.
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