High useful yield and isotopic analysis of uranium by resonance ionization mass spectrometry
- Creator: Savina, Michael R. , Isselhardt, Brett H. , Kucher, Andrew , Trappitsch, Reto , King, Bruce V. , Ruddle, David , Gopa, Raja , Hutcheon, Ian
- Resource Type: journal article
- Date: 2017
Ion microscopy with resonant ionization mass spectrometry: time-of-flight depth profiling with improved isotopic precision
- Creator: Pellin, Michael J. , Veryovkin, Igor V. , Levine, Jonathan , Zinovev, Alexander , Davis, Andrew M. , Stephan, Thomas , Tripa, C. Emil , King, Bruce V. , Savina, Michael R.
- Resource Type: journal article
- Date: 2010