Multi-level analysis of IEC 61131-3 languages to detect clones
- Creator: Jnanamurthy, H. K. , Jetley, Raoul , Henskens, Frans , Paul, David , Wallis, Mark , Sudarsan, S. D.
- Resource Type: journal article
- Date: 2020
Analysis of industrial control system software to detect semantic clones
- Creator: HK, Jnanamurthy , Jetley, Raoul , Henskens, Frans , Paul, David , Wallis, Mark , SD, Sudarsan
- Resource Type: conference paper
- Date: 2019