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Jetley, Raoul

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1No 1Yes

1PLC programs 1interval analysis 1programs 1semantic clones 1software clones 1software-reusability 1structural clones

1HK, Jnanamurthy 1Jnanamurthy, H. K. 1SD, Sudarsan 1Sudarsan, S. D.

1conference paper 1journal article

Date

12019 12020

1Adobe Acrobat PDF

Facets

Full Text

1No 1Yes

1PLC programs 1interval analysis 1programs 1semantic clones 1software clones 1software-reusability 1structural clones

1HK, Jnanamurthy 1Jnanamurthy, H. K. 1SD, Sudarsan 1Sudarsan, S. D.

1conference paper 1journal article

Date

12019 12020

1Adobe Acrobat PDF

Title
Creator
Date

Multi-level analysis of IEC 61131-3 languages to detect clones

- Jnanamurthy, H. K., Jetley, Raoul, Henskens, Frans, Paul, David, Wallis, Mark, Sudarsan, S. D.

Creator: Jnanamurthy, H. K. , Jetley, Raoul , Henskens, Frans , Paul, David , Wallis, Mark , Sudarsan, S. D.
Resource Type: journal article
Date: 2020

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Analysis of industrial control system software to detect semantic clones

- HK, Jnanamurthy, Jetley, Raoul, Henskens, Frans, Paul, David, Wallis, Mark, SD, Sudarsan

Creator: HK, Jnanamurthy , Jetley, Raoul , Henskens, Frans , Paul, David , Wallis, Mark , SD, Sudarsan
Resource Type: conference paper
Date: 2019

Analysis of industrial control system software to detect semantic clones

Creator: HK, Jnanamurthy , Jetley, Raoul , Henskens, Frans , Paul, David , Wallis, Mark , SD, Sudarsan
Resource Type: conference paper
Date: 2019

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