An automatic HyLogger™ mineral mapping method using a machine-learning-based computer vision technique
- Creator: Liu, J. , Chen, W. , Muller, M. , Chalup, S. , Wheeler, C.
- Resource Type: journal article
- Date: 2019
Automated pattern recognition and defect inspection system
- Creator: Cui, Yue , Jin, Jesse S. , Luo, Suhuai , Park, Mira , Au, Sherlock S. L.
- Resource Type: conference paper
- Date: 2010