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1atom-microscope 1atom-microscopy 1carbon-nanotubes 1chemical-vapor-deposition 1field-ionisation 1free-jet-expansion 1helium 1helium-atom-microscopy 1helium-beam 1helium-microscopy 1modelling 1neutral-atom-detection

1Dastoor, P. C. 1Fahy, A. 1O'Connor, D. J. 1O'Donnell, K. M. 1O'Donnell, Kane 1Thomsen, L.

1journal article 1thesis

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1No 1Yes

1atom-microscope 1atom-microscopy 1carbon-nanotubes 1chemical-vapor-deposition 1field-ionisation 1free-jet-expansion 1helium 1helium-atom-microscopy 1helium-beam 1helium-microscopy 1modelling 1neutral-atom-detection

1Dastoor, P. C. 1Fahy, A. 1O'Connor, D. J. 1O'Donnell, K. M. 1O'Donnell, Kane 1Thomsen, L.

1journal article 1thesis

Date

12010 12011

1Adobe Acrobat PDF

Title
Creator
Date

Field ionization detectors: a comparative model

- O'Donnell, K. M., Fahy, A., Thomsen, L., O'Connor, D. J., Dastoor, P. C.

Creator: O'Donnell, K. M. , Fahy, A. , Thomsen, L. , O'Connor, D. J. , Dastoor, P. C.
Resource Type: journal article
Date: 2011

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Field ionization detection for atom microscopy

- O'Donnell, Kane

Creator: O'Donnell, Kane
Resource Type: thesis
Date: 2010

Field ionization detection for atom microscopy

Creator: O'Donnell, Kane
Resource Type: thesis
Date: 2010

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