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High-mass heterogeneous cluster formation by ion bombardment of the ternary alloy Au₇C₅Al₄
- Zinovev, Alexander V., King, Bruce V., Veryovkin, Igor V., Pellin, Michael J.
Ion microscopy with resonant ionization mass spectrometry: time-of-flight depth profiling with improved isotopic precision
- Pellin, Michael J., Veryovkin, Igor V., Levine, Jonathan, Zinovev, Alexander, Davis, Andrew M., Stephan, Thomas, Tripa, C. Emil, King, Bruce V., Savina, Michael R.
A new horizon in secondary neutral mass spectrometry: post-ionization using a VUV free electron laser
- Veryovkin, Igor V., Calaway, Wallis F., Moore, Jerry F., Pellin, Michael J., Lewllen, John W., Li, Yuelin, Milton, Stephen V., King, Bruce V., Petravic, Mladen
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