- Title
- Characterisation of organic photovoltaics by synchrotron soft X-ray techniques
- Creator
- Burke, Kerry B.
- Relation
- University of Newcastle Research Higher Degree Thesis
- Resource Type
- thesis
- Date
- 2011
- Description
- Research Doctorate - Doctor of Philosophy (PhD)
- Description
- The use of advanced synchrotron X-ray spectroscopy and microspectroscopy techniques can probe the nanoscale structure of organic solar cells. Near Edge X-ray Absorption Fine Structure Spectroscopy (NEXAFS) is able to determine chemical composition and molecular tilt angles at interfaces with a depth sensitivity varying from ~4-10nm. Scanning Transmission X-ray Microscopy is able to determine composition of organic components in a ternary blend to within 10%, while achieving a spatial resolution of ~30nm. These techniques have been used to deliver novel results on the structure of interfaces and nanoscale morphology in organic photovoltaic devices. The results allow a greater understanding of the morphology of organic photovoltaics and enhance the uses of synchrotron X-ray spectroscopy.
- Subject
- STXM; NEXAFS; synchrotron; organic photovoltaics
- Identifier
- http://hdl.handle.net/1959.13/919757
- Identifier
- uon:8967
- Rights
- Copyright 2011 Kerry B. Burke
- Language
- eng
- Full Text
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| Thumbnail | File | Description | Size | Format | |||
|---|---|---|---|---|---|---|---|
| View Details Download | ATTACHMENT01 | Abstract | 169 KB | Adobe Acrobat PDF | View Details Download | ||
| View Details Download | ATTACHMENT02 | Thesis | 13 MB | Adobe Acrobat PDF | View Details Download |