- Title
- Measurement of the complexity of variation points in software product lines
- Creator
- Lin, Yuqing; Ye, Huilin; Tang, Jianmin
- Relation
- WRI World Congress on Software Engineering, 2009 (WCSE '09). Proceedings of the WRI World Congress on Software Engineering 2009 (Xiamen, China 19-21 May, 2009) p. 370-374
- Publisher Link
- http://dx.doi.org/10.1109/WCSE.2009.156
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Resource Type
- conference paper
- Date
- 2009
- Description
- Feature models are used in member product configuration in software product lines. A valid product configuration must satisfy two kinds of constraints, multiplicity of each variation point and dependencies among the variants in a product line. The combined impact of the two kinds of constrains on product configuration should be well understood. In this paper we propose a measurement, called VariationRank, that combines the two kinds of constraints to assess the complexity of variation points in software product lines. Based on the measurement we can identify those variation points with the highest impact on product configurations in a product line. This information could be used as guidance in product configuration as well as for feature model optimization in software product lines. A case study is presented and discussed in this paper as well.
- Subject
- VariationRank; complexity measurement; feature model optimization; member product configuration; product line variant dependencies; software product lines; variation point multiplicity
- Identifier
- http://hdl.handle.net/1959.13/919060
- Identifier
- uon:8770
- Identifier
- ISBN:9780769535708
- Rights
- Copyright © 2009 IEEE. Reprinted from the Proceedings of the WRI World Congress on Software Engineering 2009. This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of University of Newcastle's products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org. By choosing to view this document, you agree to all provisions of the copyright laws protecting it.
- Language
- eng
- Full Text
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