- Title
- A fast and automatic approach to extract the brain and midsagittal lines from FDG-PET head scans
- Creator
- Qian, Guoyu; Luo, Suhuai; Jin, Jesse; Park, Mira; Li, Jiaming; Nowinski, Wieslaw L.
- Relation
- 1st International Conference on Information Science and Engineering (ICISE 2009). ICISE: The 1st International Conference on Information Science and Engineering: Proceedings (Nanjing, China 18-20 December, 2009)
- Publisher Link
- http://dx.doi.org/10.1109/ICISE.2009.28
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Resource Type
- conference paper
- Date
- 2009
- Description
- A fully automated approach is presented to extract brain areas efficiently from FDG-PET head scans. A threshold value is automatically calculated from the histogram graph of the brain images, followed by region growing and morphological operations, to segment brain areas from these images. Next, the midsagittal lines on axial slices are detected to separate the brain into two hemispheres. The proposed approach has been applied to 226 cases of normal controls and patients with neurological diseases. The average processing time is about 3 seconds on a standard personal computer. The experiment has shown promising results.
- Subject
- biomedical imaging; image processing; positron emission tomography
- Identifier
- http://hdl.handle.net/1959.13/918888
- Identifier
- uon:8730
- Identifier
- ISBN:9780769538877
- Rights
- Copyright © 2009 IEEE. Reprinted from the ICISE: The 1st International Conference on Information Science and Engineering: Proceedings. This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of University of Newcastle's products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org. By choosing to view this document, you agree to all provisions of the copyright laws protecting it.
- Language
- eng
- Full Text
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