- Title
- Measuring the tilt angle of ODTMS self-assembled monolayers on Al oxide surfaces
- Creator
- Thomsen, Lars; Watts, Benjamin; Cotton, Daniel Vincent; Dastoor, Paul Christopher
- Relation
- Synthetic Metals Vol. 154, no. 1-3, p. 9-12
- Publisher
- Elsevier
- Resource Type
- journal article
- Date
- 2005
- Description
- Adsorbed octadecyltrimethoxysilane (ODTMS) on native aluminium oxide substrates have been studied with near-edge X-ray absorption fine structure (NEXAFS) spectroscopy in order to determine the average tilt angle of the surface film. Previous experiments have shown that the time-dependant adsorption isotherm of ODTMS on Al exhibits oscillatory adsorption. In this work we present the findings of our tilt angle studies for Al samples dipped in a 0.75% ODTMS solution at various times during oscillatory adsorption. It clearly can be seen that the alignment of the surface film is related to the coverage, hence for a minimum in the film coverage (at 65 s dip time) the tilt angle of the ODTMS film is found to be ~50° relative to the surface normal. Below the minimum in the film coverage (at 30 s dip time) the tilt angle has been found to be ~41° whereas for samples dipped above the minimum film coverage (at 80 and 95 s) the angles are ~46° and ~45° respectively. These measurements indicate a strong correlation between film alignment and film coverage during oscillatory adsorption.
- Identifier
- uon:578
- Identifier
- http://hdl.handle.net/1959.13/24669
- Identifier
- ISSN:0379-6779
- Language
- eng
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