- Title
- Beneficiation of High-Density Tantalum Ore in the REFLUX™ Concentrating Classifier Analysed Using Batch Fractionation Assay and Density Data
- Creator
- Iveson, Simon M.; Boonzaier, Nicolas; Galvin, Kevin P.
- Relation
- Minerals Vol. 14, Issue 2, no. 197
- Publisher Link
- http://dx.doi.org/10.3390/min14020197
- Publisher
- MDPI AG
- Resource Type
- journal article
- Date
- 2024
- Description
- A laboratory-scale REFLUX™ Concentrating Classifier was operated in continuous mode to beneficiate a sub 0.100 mm tantalum ore with a head grade of 0.56 wt.% Ta. The unit incorporated a lower section with a reduced diameter to accommodate a low yield. At a yield to underflow product of 4.0 wt.%, a product grade of 13.3 wt.% was achieved (23.7 upgrade) at a recovery of 88.3%. Samples of the feed, product and reject were then fractionated in a batch REFLUX™ Classifier unit using dense lithium heteropolytungstate (LST) solution into 11 fractions. Each of these fractions was then screened into seven size intervals and analysed by pycnometry and X-ray fluorescence (XRF). Most of the material was found to reside in four relatively narrow density bands. A new analysis based on the recovery of selected tracer elements showed that the partition curve had good closure at both ends and that the density cut point and Ep both increased with decreasing particle size. For the +0.045 mm material, the density cut point was estimated to be around 3952 kg/m3 with an Ep of 317 kg/m3, but it was expected that this new method could overestimate Ep. An alternative novel approach for estimating the partition performance was developed. This method estimated the cut point and Ep values to be 3764 kg/m3 and 107 kg/m3, respectively. However, sensitivity analysis found that due to the near total absence of material in the density range from 3400 kg/m3 to 4700 kg/m3, the Ep could likely lie anywhere in the range from 0 to 250 kg/m3. The methodology proved useful in establishing these limitations in the analysis.
- Subject
- benefication; gravity separation; density separation; REFLUX™ Classifier; REFLUX™ Concentrating Classifier; tantalum
- Identifier
- http://hdl.handle.net/1959.13/1505540
- Identifier
- uon:55686
- Identifier
- ISSN:2075-163X
- Rights
- x
- Language
- eng
- Reviewed
- Hits: 18
- Visitors: 18
- Downloads: 0