- Title
- Specific Ion Effects at the Vapor-Formamide Interface: A Reverse Hofmeister Series in Ion Concentration Depth Profiles
- Creator
- Kumar, Anand; Craig, Vincent S. J.; Robertson, Hayden; Page, Alister J.; Webber, Grant B.; Wanless, Erica J.; Mitchell, Valerie D.; Andersson, Gunther G.
- Relation
- ARC.DP190100788 http://purl.org/au-research/grants/arc/DP190100788
- Relation
- Langmuir Vol. 39, Issue 36, p. 12618-12626
- Publisher Link
- http://dx.doi.org/10.1021/acs.langmuir.3c01286
- Publisher
- American Chemical Society
- Resource Type
- journal article
- Date
- 2023
- Description
- Employing neutral impact collision ion scattering spectroscopy (NICISS), we have directly measured the concentration depth profiles (CDPs) of various monovalent ions at the vapor-formamide interface. NICISS provides CDPs of individual ions by measuring the energy loss of neutral helium atoms backscattered from the solution interface. CDPs at the vapor-formamide interface of Cl-, Br-, I-, Na+, K+, and Cs+ are measured and compared to elucidate the interfacial specific ion trends. We report a reverse Hofmeister series in the presence of inorganic ions (anion and cation) at the vapor-formamide interface relative to the water-vapor interface, and the CDPs are found to be independent of the counterion for most ions studied. Thus, ions at the surface of formamide follow a "Hofmeister paradigm" where the counterion does not impact the ion series. These specific ion trends are complemented with surface tension and X-ray absorption near-edge structure (XANES) measurements on formamide electrolyte solutions.
- Subject
- neutral impact collision ion scattering spectroscopy (NICISS); concentration depth profiles (CDPs); ions; Hofmeister series
- Identifier
- http://hdl.handle.net/1959.13/1486838
- Identifier
- uon:51970
- Identifier
- ISSN:0743-7463
- Language
- eng
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