Screening for artifacts in near-field scanning photocurrent microscopy images of polymer solar cells

Title: Screening for artifacts in near-field scanning photocurrent microscopy images of polymer solar cells
Creator: McNeill, Christopher Robert; Fell, Christopher James; Holdsworth, John Lionel; Dastoor, Paul Christopher
Relation: Synthetic Metals Vol. 153, no. 1-3, p. 85-88
Publisher: Elsevier
Resource Type: journal article
Date: 2005
Description: We present the results of an investigation to screen for the presence of artifacts in near-field scanning photocurrent microscopy (NSPM) images of polymer solar cells caused by variations in tip-sample separation. We show that by increasing the size of the probe tip we are able to deliberately degrade the surface topographical image without altering the photocurrent image. This work demonstrates that NSPM images of polymer solar cells reliably probe the local charge generation properties of the device and are not significantly influenced by the presence of artifacts. Polyfluorene blend solar cells are used as a model system for this study.
Identifier: uon:478
Identifier: http://hdl.handle.net/1959.13/25241
Identifier: ISSN:0379-6779
Language: eng
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