- Title
- Scanning probe microscopy for silicon device fabrication
- Creator
- Simmons, M. Y.; Ruess, F. J.; Reusch, T. C. G.; Goh, K. E. J.; Hallam, T.; Schofield, S. R.; Oberbeck, L.; Curson, N. J.; Hamilton, A. R.; Butcher, M. J.; Clark, R. G.
- Relation
- Molecular Simulation Vol. 31, Issue 6-7, p. 505-514
- Publisher Link
- http://dx.doi.org/10.1080/08927020500035580
- Publisher
- Taylor & Francis
- Resource Type
- journal article
- Date
- 2005
- Description
- We present a review of a detailed fabrication strategy for the realisation of nano and atomic-scale devices in silicon using phosphorus as a dopant and a combination of ultra-high vacuum scanning probe microscopy and silicon molecular beam epitaxy (MBE). In this work we have been able to overcome some of the key fabrication challenges to the realisation of atomic-scale devices including the identification of single P dopants in silicon, the controlled incorporation of P atoms in silicon with atomic precision and the minimisation of P segregation and diffusion during Si encapsulation. Recently, we have combined these results with a novel registration technique to fabricate robust electrical devices in silicon that can be contacted and measured outside the ultra-high vacuum environment. We discuss the importance of our results for the future fabrication of atomic-scale devices in silicon.
- Subject
- scanning tunneling microscopy; nanoelectronics; silicon; lithography
- Identifier
- http://hdl.handle.net/1959.13/33976
- Identifier
- uon:3433
- Identifier
- ISSN:0892-7022
- Language
- eng
- Reviewed
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