- Title
- Estimation of useful yield in surface analysis using single photon ionisation
- Creator
- King, B. V.; Pellin, M. J.; Moore, J. F.; Veryovkin, I. V.; Savina, M. R.; Tripa, C. E.
- Relation
- Applied Surface Science Vol. 203 - 204 , p. 244-247
- Publisher Link
- http://dx.doi.org/10.1016/S0169-4332(02)00636-0
- Publisher
- Elsevier BV
- Resource Type
- journal article
- Date
- 2003
- Description
- Secondary ion mass spectrometry (SIMS), laser sputter neutral mass spectrometry (SNMS) and laser desorption photoionisation (LDPI) have been used to investigate the desorption of molecules from self-assembled monolayers of phenylsulphides. LDPI, using an F₂ excimer laser to single photon ionise gave the lowest fragmentation. A useful yield greater than 0.5% was found for analysis of diphenyldisulphide self-assembled monolayers. It is shown that using a free electron laser to postionise will lead, in the future, to analysis of many atoms and molecules with useful yields approaching 30%.
- Subject
- postionisation; laser desorption; SIMS; SAM; useful lead
- Identifier
- http://hdl.handle.net/1959.13/32242
- Identifier
- uon:2963
- Identifier
- ISSN:0169-4332
- Language
- eng
- Reviewed
- Hits: 3717
- Visitors: 3987
- Downloads: 0
| Thumbnail | File | Description | Size | Format |
|---|