- Title
- Spiral scanning: an alternative to conventional raster scanning in high-speed scanning probe microscopes
- Creator
- Mahmood, I. A.; Moheimani, S. O. R.
- Relation
- 2010 American Control Conference (ACC 2010). Proceedings of the American Control Conference, 2010 (Baltimore, MD 30 June - 2 July, 2010) p. 5757-5762
- Relation
- http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=5530444
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Resource Type
- conference paper
- Date
- 2010
- Description
- A spiral scanning method for high-speed Atomic Force Microscopy (AFM) is described in this paper. In this method, the sample is scanned in a spiral pattern instead of the conventional raster pattern. A spiral scan can be produced by applying single frequency cosine and sine signals with slowly varying amplitudes to the x axis and y axis of an AFM scanner respectively. The use of the single tone input signals allows the scanner to move at high speeds without exciting the mechanical resonance of the device and with relatively small control efforts. These scan methods can be incorporated into most modern AFMs with minimal effort since they can be implemented in software using the existing hardware. Experimental results obtained by implementing this scanning method on a commercial AFM indicate that the obtained images are of a good quality and the profile of the calibration grating is well captured up to scan frequency of 120 Hz with a scanner where the first resonance frequency is 580 Hz.
- Subject
- atomic force microscopy; calibration; image scanners
- Identifier
- http://hdl.handle.net/1959.13/933558
- Identifier
- uon:11654
- Identifier
- ISBN:9781424474264
- Identifier
- ISSN:0743-1619
- Rights
- Copyright © 2010 IEEE. Reprinted from the Proceedings of the American Control Conference, 2010. This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of the University of Newcastle's products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org. By choosing to view this document, you agree to all provisions of the copyright laws protecting it.
- Language
- eng
- Full Text
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