High-speed cycloid-scan atomic force microscopy

Title: High-speed cycloid-scan atomic force microscopy
Creator: Yong, Y. K.; Moheimani, S. O. R.; Petersen, I. R.
Relation: Nanotechnology Vol. 21, Issue 36
Publisher Link: http://dx.doi.org/10.1088/0957-4484/21/36/365503
Publisher: Institute of Physics Publishing
Resource Type: journal article
Date: 2010
Description: A key hurdle in achieving high scan speeds in atomic force microscopes is that the probe is required to be scanned over the sample in a zig-zag raster pattern. The fast axis of the AFM scanner must track a signal that contains frequencies beyond its mechanical bandwidth. Consequently, fast raster scans generate distortions in the resulting image. We propose a smooth cycloid-like scan pattern that allows us to achieve scan speeds much higher than a raster scan. We illustrate how the proposed method can be implemented on a commercial AFM with minimal modifications.
Subject: atomic force microscopes; raster scans; cycloid scans; scan speeds
Identifier: http://hdl.handle.net/1959.13/931836
Identifier: uon:11180
Identifier: ISSN:0957-4484
Language: eng
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