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Moheimani, S. O. Reza

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Date: 2017
Language: eng
Resource Type: journal article
Identifier: http://hdl.handle.net/1959.13/1348700
Description: In this review paper, traditional and novel demodulation methods applicable to amplitude-modulation atomic force microscopy are implemented on a widely used digital processing system. As a crucial ban... More
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Date: 2017
Language: eng
Resource Type: conference paper
Identifier: http://hdl.handle.net/1959.13/1348369
Description: This paper presents a novel microelectromechanical systems (MEMS) implementation of an on-chip atomic force microscope (AFM), fabricated using a silicon-on-insulator process. The device features an XY... More
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Date: 2017
Language: eng
Resource Type: conference paper
Identifier: http://hdl.handle.net/1959.13/1348360
Description: A fundamental but often overlooked component in the z-axis feedback loop of the atomic force microscope (AFM) operated in dynamic mode is the demodulator. Its purpose is to obtain a preferably fast an... More
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Date: 2017
Language: eng
Resource Type: journal article
Identifier: http://hdl.handle.net/1959.13/1349709
Description: The atomic force microscope (AFM) is an invaluable scientific tool; however, its conventional implementation as a relatively costly macroscale system is a barrier to its more widespread use. A microel... More
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Date: 2017
Language: eng
Resource Type: conference paper
Identifier: http://hdl.handle.net/1959.13/1350845
Description: This work outlines the instrumentation and actuation of a MEMS nanopositioner, implementing a switching electronics based self-sensing actuation technique. Self-sensing actuation allows for optimal us... More
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Date: 2016
Language: eng
Resource Type: conference paper
Identifier: http://hdl.handle.net/1959.13/1316001
Description: A silicon-on-insulator microelectromechanical systems (MEMS)-based energy harvester potentially suitable for applications such as implanted biomedical systems is presented. Designed to be mechanically... More
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Date: 2016
Language: eng
Resource Type: journal article
Identifier: http://hdl.handle.net/1959.13/1349015
Description: We describe a novel high-bandwidth two degree of freedom microelectromechanical system nanopositioner. On-chip piezoresistive sensors and four electrostatic actuators are incorporated. The bulk piezor... More
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Date: 2016
Language: eng
Resource Type: journal article
Identifier: http://hdl.handle.net/1959.13/1339112
Description: This paper presents a microelectromechanical systems (MEMS)-based energy harvester that is designed to harvest electrical energy from an external source of ultrasonic waves. The harvester features a n... More
Reviewed: Reviewed
Date: 2016
Language: eng
Resource Type: journal article
Identifier: http://hdl.handle.net/1959.13/1340203
Description: A fundamental challenge in dynamic mode atomic force microscopy (AFM) is the estimation of the cantilever oscillation amplitude from the deflection signal, which might be distorted by noise and/or hig... More
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Date: 2016
Language: eng
Resource Type: conference paper
Identifier: http://hdl.handle.net/1959.13/1346919
Description: MEMS technology is being investigated to improve the performance, integration and cost of nanopositioning systems. The most basic MEMS fabrication processes produce designs etched into a single layer ... More
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Date: 2016
Language: eng
Resource Type: conference paper
Identifier: http://hdl.handle.net/1959.13/1345329
Description: In this paper we study the origins of the cross coupling phenomenon in MEMS nanopositioners with a parallel kinematic mechanism. An analytical model is provided for a generic 2-DOF MEMS nanopositioner... More
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Date: 2016
Language: eng
Resource Type: journal article
Identifier: http://hdl.handle.net/1959.13/1340202
Description: Emerging multifrequency atomic force microscopy (MF-AFM) methods rely on coherent demodulation of the cantilever deflection signal at multiple frequencies. These measurements are needed in order to cl... More
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Date: 2016
Language: eng
Resource Type: journal article
Identifier: http://hdl.handle.net/1959.13/1346041
Description: Using standard microelectromechanical system (MEMS) processes to coat a microcantilever with a piezoelectric layer results in a versatile transducer with inherent self-sensing capabilities. For applic... More
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Date: 2016
Language: eng
Resource Type: journal article
Identifier: http://hdl.handle.net/1959.13/1347005
Description: We demonstrate the application of internal model control for accurate tracking of spiral scan trajectories, where the reference signals are orthogonal sinusoids whose amplitudes linearly vary with tim... More
Reviewed: Reviewed
Date: 2016
Language: eng
Resource Type: journal article
Identifier: http://hdl.handle.net/1959.13/1320223
Description: Numerous dynamic atomic force micros- copy (AFM) methods have appeared in recent years, which make use of the excitation and detection of higher order eigenmodes of the microcantilever. The ability to... More
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