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| Title | Author/Creator | Date | Full Text | Reviewed | |
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| Atomic force microscopy with a 12-electrode piezoelectric tube scanner | Yong, Yuen K.; Ahmed, Bilal; Moheimani, S. O. Reza | 2010 | 
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| Making a commercial atomic force microscope more accurate and faster using positive position feedback control | Mahmood, I. A.; Moheimani, S. O. Reza | 2009 |
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| A survey of control issues in nanopositioning | Devasia, Santosh; Eleftheriou, Evangelos; Moheimani, S. O. Reza | 2007 |
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| Charge driven piezoelectric actuators for structural vibration control: Issues and implementation | Vautier, Benjamin Jean Guillaume; Moheimani, S. O. Reza | 2005 | — |
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Author/Creator
- Ahmed, Bilal (1)
- Devasia, Santosh (1)
- Eleftheriou, Evangelos (1)
- Mahmood, I. A. (1)
- Vautier, Benjamin Jean Guillaume (1)
- Yong, Yuen K. (1)
Keyword
- actuators (2)
- atomic force microscopy (2)
- amplifiers (electronic) (1)
- atomic force microscopy (AFM) (1)
- cantilever beams (1)
- compensation (1)
- electric charge (1)
- electric fields (1)
- electric potential (1)
