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| Title | Author/Creator | Date | Full Text | Reviewed | |
|---|---|---|---|---|---|
| Automated pattern recognition and defect inspection system | Cui, Yue; Jin, Jesse S.; Luo, Suhuai; Park, Mira; Au, Sherlock S. L. | 2010 | — | 
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| A unifying discussion of correlation analysis for complex random vectors | Schreier, Peter J. | 2008 | — |
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Author/Creator
- Au, Sherlock S. L. (1)
- Cui, Yue (1)
- Jin, Jesse S. (1)
- Luo, Suhuai (1)
- Park, Mira (1)
- Schreier, Peter J. (1)
Keyword
- area estimation function (1)
- automated pattern recognition (1)
- automated vision based defect inspection system (1)
- canonical correlations (1)
- cigarette laying defect (1)
- cigarette manufacturing (1)
- cigarette packaging defect (1)
- correlation analysis (1)
- improper complex random vector (1)
- k-means clustering (1)
Resource Type
- conference paper (1)
- journal article (1)
