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| Title | Author/Creator | Date | Full Text | Reviewed | |
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| Atomic force microscopy with a 12-electrode piezoelectric tube scanner | Yong, Yuen K.; Ahmed, Bilal; Moheimani, S. O. Reza | 2010 | 
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| A compact XYZ scanner for fast atomic force microscopy in constant force contact mode | Yong, Yuen Kuan; Moheimani, S. O. Reza | 2010 | — |
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| Spiral-scan atomic force microscopy: a constant linear velocity approach | Mahmood, Iskandar A.; Moheimani, S. O. Reza | 2010 | — |
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| Making a commercial atomic force microscope more accurate and faster using positive position feedback control | Mahmood, I. A.; Moheimani, S. O. Reza | 2009 |
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| Invited review article: accurate and fast nanopositioning with piezoelectric tube scanners: emerging trends and future challenges | Moheimani, S. O. Reza | 2008 |
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| A survey of control issues in nanopositioning | Devasia, Santosh; Eleftheriou, Evangelos; Moheimani, S. O. Reza | 2007 |
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| A grounded-load charge amplifier for reducing hysteresis in piezoelectric tube scanners | Fleming, Andrew J.; Moheimani, S. O. Reza | 2005 |
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Author/Creator
- Ahmed, Bilal (1)
- Devasia, Santosh (1)
- Eleftheriou, Evangelos (1)
- Fleming, Andrew J. (1)
- Mahmood, I. A. (1)
- Mahmood, Iskandar A. (1)
- Yong, Yuen K. (1)
- Yong, Yuen Kuan (1)
Keyword
- atomic force microscopy (4)
- actuators (3)
- piezoelectric devices (3)
- atomic-force microscopy (2)
- AFM (1)
- atomic force microscopy (AFM) (1)
- bending (1)
- charge amplifiers (1)
- circuits (1)
- compensation (1)
Resource Type
- journal article (5)
- conference paper (2)
