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Date: 2014
Language: eng
Resource Type: journal article
Identifier: http://hdl.handle.net/1959.13/1068150
Description: Raster scanning is common in atomic force microscopy (AFM). The nonsmooth raster waveform contains high-frequency content that can excite mechanical resonances of an AFM nanopositioner during a fast s... More
Reviewed: Reviewed
Date: 2012
Language: eng
Resource Type: journal article
Identifier: http://hdl.handle.net/1959.13/1309294
Description: A transfer-function is said to be negative imaginary if the corresponding frequency response function has a negative definite imaginary part (on the positively increasing imaginary axis). Negative ima... More
Reviewed: Reviewed
Creators: Fleming, Andrew J.
Date: 2010
Language: eng
Resource Type: journal article
Identifier: http://hdl.handle.net/1959.13/931552
Description: In this study, the actuator load force of a nanopositioning stage is utilized as a feedback variable to achieve both tracking and damping. The transfer function from the applied actuator voltage to th... More
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Reviewed: Reviewed
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Date: 2009
Resource Type: conference paper
Identifier: uon:8717
Description: In this work, we propose a new control approach for a single-link flexible manipulator, based on the integral resonant control (IRC) scheme. A hybrid control scheme consisting of two nested loops by t... More
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Reviewed: Reviewed
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Date: 2008
Language: eng
Resource Type: conference paper
Identifier: http://hdl.handle.net/1959.13/45172
Description: We present a fast flexure-based, piezoelectric stack-actuated XY nanopositioning stage which is suitable for high-speed, accurate nanoscale positioning applications. The performance of the design are ... More
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Reviewed: Reviewed
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