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| Title | Author/Creator | Date | Full Text | Reviewed | |
|---|---|---|---|---|---|
| NEXAFS microscopy of polymeric materials: successes and challenges encountered when characterizing organic devices | Ade, H.; Watts, B.; Swaraj, S.; McNeill, C.; Thomsen, L.... More | 2009 | — | 
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| X-ray spectromicroscopy of polymer/ fullerene composites: quantitative chemical mapping | McNeill, Christopher R.; Watts, Benjamin; Thomsen, Lars; Belcher, Warwick J.; Kilcoyne, A. L. David... More | 2006 | — |
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Author/Creator
- Ade, H. (1)
- Belcher, W. (1)
- Belcher, Warwick J. (1)
- Dastoor, P. C. (1)
- Dastoor, Paul C. (1)
- Greenham, Neil C. (1)
- Kilcoyne, A. L. David (1)
- McNeill, C. (1)
- McNeill, Christopher R. (1)
- Swaraj, S. (1)
Keyword
- NEXAFS microscopy (1)
- fullerenes (1)
- organic devices (1)
- phase morphology (1)
- polymer blends (1)
- polymers (1)
- solar cells (1)
Resource Type
- conference paper (1)
- journal article (1)
