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| Title | Author/Creator | Date | Full Text | Reviewed | |
|---|---|---|---|---|---|
| A 12-electrode piezoelectric tube scanner for fast atomic force microscopy | Yong, Yuen K.; Ahmed, Bilal; Moheimani, S. O. R. | 2010 | 
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| Tracking control of a novel AFM scanner using signal transformation method | Bazaei, Ali; Yong, Yuen K.; Moheimani, S. O. Reza; Sebastian, Abu | 2010 | — |
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Author/Creator
- Ahmed, Bilal (1)
- Bazaei, Ali (1)
- Moheimani, S. O. R. (1)
- Moheimani, S. O. Reza (1)
- Sebastian, Abu (1)
Keyword
- atomic force microscope (1)
- atomic force microscopy (1)
- control bandwidth (1)
- displacement measurements (1)
- hybrid control system (1)
- piezoelectric tube scanners (1)
- piezoelectricity (1)
- scanning (1)
- sensor noise (1)
- signal transformation (1)
