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| Title | Author/Creator | Date | Full Text | Reviewed | |
|---|---|---|---|---|---|
| Layer model approach to background correction in r.f.-GDOES | Payling, R.; Nelis, T.; Aeberhard, M.; Michler, J.; Seris, P. | 2004 | — | 
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| Rf-GDOES depth profiling analysis of a monolayer of thiourea adsorbed on copper | Shimizu, K.; Payling, R.; Habazaki, H.; Skeldon, P.; Thompson, G. E. | 2004 | — |
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Author/Creator
- Aeberhard, M. (1)
- Habazaki, H. (1)
- Michler, J. (1)
- Nelis, T. (1)
- Seris, P. (1)
- Shimizu, K. (1)
- Skeldon, P. (1)
- Thompson, G. E. (1)
Keyword
- GDOES (1)
- background correction (1)
- copper substrate (1)
- depth profiling analysis (1)
- layer model (1)
- radiofrequency (1)
- rf-GDOES (1)
- thiourea molecules (1)
