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| Title | Author/Creator | Date | Full Text | Reviewed | |
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| Pattern recognition from segmented images in automated inspection systems | Park, Mira; Jin, Jesse S.; Au, Sherlock L.; Luo, Suhuai | 2008 | 
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| Automated defect inspection systems by pattern recognition | Park, Mira; Jin, Jesse S.; Au, Sherlock L.; Luo, Suhuai; Cui, Yue | 2009 | — |
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