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| Title | Author/Creator | Date | Full Text | Reviewed | |
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| Atomic force microscopy with a 12-electrode piezoelectric tube scanner | Yong, Yuen K.; Ahmed, Bilal; Moheimani, S. O. Reza | 2010 | 
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| A 12-electrode piezoelectric tube scanner for fast atomic force microscopy | Yong, Yuen K.; Ahmed, Bilal; Moheimani, S. O. R. | 2010 |
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Author/Creator
Keyword
- displacement measurements (1)
- high-speed AFMs (1)
- piezoelectric devices (1)
- piezoelectric tube scanners (1)
- piezoelectricity (1)
- scanning (1)
- scanning systems (1)
Resource Type
- conference paper (1)
- journal article (1)
