Please use this identifier to cite or link to this item: http://hdl.handle.net/1959.13/919636

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Title
NEXAFS microscopy of polymeric materials: successes and challenges encountered when characterizing organic devices
Author/Creator
Ade, H.;  Watts, B.;  Swaraj, S.;  McNeill, C.;  Thomsen, L.;  Belcher, W.;  Dastoor, P. C.
Institution
The University of Newcastle. Faculty of Science & Information Technology, School of Mathematical and Physical Sciences
Description
We summarize recent developments in x-ray microscopy of polymers by focusing on the characterization of organic electronic devices. The quantitative compositions of model polymer blends have been mapped at a resolution of ~35 nm. Since it could be inferred that these devices have structures smaller than 35 nm, quantitative compositional mapping at length scales below the present resolution limit of x-ray microscopy is required. Organic devices thus serve to both highlight the success of NEXAFS microscopy to date, but to also outline the very real need for higher spatial resolution. New approaches to create improved optics or different acquisition modalities are required if x-ray microscopy is to make sustained contributions to such an important area of research as organic devices.
Relation
9th International Conference on X-Ray Microscopy (XRM 2008). Journal of Physics: Conference Series, Volume 186, Number 1 (Zurich, Switzerland July 21-25, 2009)
Publisher Link
http://dx.doi.org/10.1088/1742-6596/186/1/012102
Date
2009
Publisher
Institute of Physics (IOP) Publishing
Keyword(s)
NEXAFS microscopy;  x-ray microscopy;  polymers;  organic devices
Resource Type
conference paper
Identifier
http://hdl.handle.net/1959.13/919636
Identifier
ISSN:1742-6588
Reviewed
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Subject
"NEXAFS microscopy of polymeric materials: successes and challenges encountered when characterizing organic devices"
 
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