Please use this identifier to cite or link to this item: http://hdl.handle.net/1959.13/918815

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Title
High-speed vertical positioning for contact-mode atomic force microscopy
Author/Creator
Fleming, Andrew J.
Institution
The University of Newcastle. Faculty of Engineering & Built Environment, School of Electrical Engineering and Computer Science
Description
Many popular modes of scanning probe microscopy require a vertical feedback system to regulate the tip-sample interaction. Unfortunately the vertical feedback controller imposes a severe limit on the scan-speed of scanning probe microscopes. In this paper, the foremost bandwidth limitation is identified to be the low-frequency mechanical resonances of the scanner. To overcome this limitation, a dual-stage vertical positioner is proposed. In this work, the bandwidth of a contact-mode atomic force microscope is increased from 83 Hz to 2.7 kHz. This improvement allows image quality to be retained with a speed increase of 33 times, or alternatively, feedback error can be reduced by 33 times if scan speed is not increased.
Relation
2009 IEEE/ASME International Conference on Advanced Intelligent Mechatronics. Proceedings of the 2009 IEEE/ASME International Conference on Advanced Intelligent Mechatronics (Singapore 14-17 July, 2009) p. 522-527
Publisher Link
http://dx.doi.org/10.1109/AIM.2009.5229959
Date
2009
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Keyword(s)
bandwidth limitation;  contact-mode atomic force microscopy;  frequency 83 Hz to 2.7 kHz;  high-speed vertical positioning;  scanning probe microscopy;  vertical feedback controller
Resource Type
conference paper
Identifier
http://hdl.handle.net/1959.13/918815
Identifier
ISBN:9781424428526
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Subject
"High-speed vertical positioning for contact-mode atomic force microscopy"
 
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