Please use this identifier to cite or link to this item: http://hdl.handle.net/1959.13/808629
- Title
- The adsorption and stability of sulfur containing amino acids on Cu{5 3 1}
- Author/Creator
-
Thomsen, L.;
Wharmby, M. T.;
Riley, D. P.;
Held, G.;
Gladys, M. J.
- Institution
- The University of Newcastle. Faculty of Science & Information Technology, School of Mathematical and Physical Sciences
- Description
- The adsorption of ʟ-cysteine and ʟ-methionine amino acids on a chiral Cu{5 3 1} surface was investigated with high resolution X-ray photoelectron spectroscopy (XPS) and carbon K-edge near edge X-ray absorption fine structure (NEXAFS) Spectroscopy using synchrotron radiation. XPS shows that at 300 K ʟ-cysteine adsorbs through two oxygen, a nitrogen and a sulfur atom, in a four point ‘quadrangular footprint’, whereas ʟ-methionine adsorbs through only two oxygen and a nitrogen atom in a ‘triangular footprint’. NEXAFS was used to clarify the adsorption geometry of both molecules, which suggests a binding orientation to the top layer and second layer atoms in two different orientations associated with adsorption sites on {1 1 0} and {3 1 1} microfacets of the Cu{5 3 1} surface.
- Relation
- Surface Science Vol. 603, Issue 9, p. 1253-1261
- Publisher Link
- http://dx.doi.org/10.1016/j.susc.2009.03.014
- Date
- 2009
- Publisher
- Elsevier
- Keyword(s)
-
near edge X-ray absorption fine structure (NEXAFS);
x-ray photoelectron spectroscopy (XPS);
synchrotron radiation;
chiral surface;
amino acid;
copper;
enantioselectivity;
self assembly
- Resource Type
- journal article
- Identifier
- http://hdl.handle.net/1959.13/808629
- Identifier
- ISSN:0039-6028
- Reviewed
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