Please use this identifier to cite or link to this item: http://hdl.handle.net/1959.13/24676
- Title
- Phosphine adsorption and dissociation on the Si(001) surface: an ab initio survey of structures
- Author/Creator
-
Warschkow, O.;
Wilson, H. F.;
Marks, N. A.;
Schofield, S. R.;
Curson, N. J.;
Smith, P. V.;
Radny, M. W.;
McKenzie, D. R.;
Simmons, M. Y.
- Description
- We report a comprehensive ab initio survey of possible dissociation intermediates of phosphine (PH3) on the Si(001) surface. We assign three scanning tunneling microscopy (STM) features, commonly observed in room-temperature dosing experiments, to PH2+H, PH+2H, and P+3H species, respectively, on the basis of calculated energetics and STM simulation. These assignments and a time series of STM images which shows these three STM features converting into another, allow us to outline a mechanism for the complete dissociation of phosphine on the Si(001) surface. This mechanism closes an important gap in the understanding of the doping process of semiconductor devices.
- Relation
- Physical Review B Vol. 72, no. 12
- Publisher Link
- http://dx.doi.org/10.1103/PhysRevB.72.125328
- Date
- 2005
- Publisher
- American Physical Society
- Keyword(s)
-
scanning-tunneling-microscopy;
si(100) surface;
wannier functions;
quantum computer;
ph3;
silicon;
phosphorus;
density;
photoemission;
desorption
- Resource Type
- journal article
- Identifier
- http://hdl.handle.net/1959.13/24676
- Identifier
- ISSN:1098-0121
- Language
- eng
- Reviewed

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