A review of techniques for attaching micro- and nanoparticles to a probe's tip for surface force and near-field optical measurements (Invited review article) | NOVA. The University of Newcastle's Digital Repository

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Please use this identifier to cite or link to this item: http://hdl.handle.net/1959.13/33750

Title: A review of techniques for attaching micro- and nanoparticles to a probe's tip for surface force and near-field optical measurements (Invited review article)
Author/Creator: Gan, Yang
Institution: The University of Newcastle. Faculty of Health, School of Medicine and Public Health
Description: Cantilevers with single micro- or nanoparticle probes have been widely used for atomic force microscopy surface force measurements and apertureless scanning near-field optical microscopy applications. In this article, I critically review the particle attachment and modification techniques currently available, to help researchers choose the appropriate techniques for specific applications.
Relation: Review of Scientific Instruments Vol. 78, Issue 8
Publisher Link: http://dx.doi.org/10.1063/1.2754076
Date: 2007
Publisher: American Institute of Physics
Keyword(s): cantilevers; atomic force microscopy; near-field scanning optical microscopy; reviews; micromechanical devices; nanotechnology; nanoparticles
Resource Type: journal article
Identifier: http://hdl.handle.net/1959.13/33750
Identifier: ISSN:0034-6748

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