Please use this identifier to cite or link to this item: http://hdl.handle.net/1959.13/29245

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Title
A new horizon in secondary neutral mass spectrometry: post-ionization using a VUV free electron laser
Author/Creator
Veryovkin, Igor V.;  Calaway, Wallis F.;  Moore, Jerry F.;  Pellin, Michael J.;  Lewllen, John W.;  Li, Yuelin;  Milton, Stephen V.;  King, Bruce V.;  Petravic, Mladen
Description
A newnext term time-of-flight (TOF) mass spectrometer incorporating post-ionization of sputtered neutral species with tunable vacuum ultraviolet (VUV) light generated by previous termanext term free electron laser (FEL) has been developed. Capabilities of this instrument, called SPIRIT, were demonstrated by experiments with photoionization of sputtered neutral gold atoms with 125 nm light generated by the VUV FEL located at Argonne National Laboratory (ANL). In previous termanext term separate series of experiments with previous termanext term fixed wavelength VUV light source, previous termanext term 157 nm F2 laser, previous termanext term useful yield (atoms detected per atoms sputtered) of about 12% and previous termanext term mass resolution better than 1500 were demonstrated for molybdenum.
Relation
Applied Surface Science , p. 962-966
Publisher Link
http://dx.doi.org/10.1016/j.apsusc.2004.03.191
Date
2004
Publisher
Elsevier Science BV
Keyword(s)
secondary neutral mass spectrometry;  photoionization of atoms and molecules;  laser desorption;  free electron laser
Resource Type
journal article
Identifier
http://hdl.handle.net/1959.13/29245
Identifier
ISSN:0169-4332
Reviewed
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Subject
"Applied Surface Science"
 
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