Please use this identifier to cite or link to this item: http://hdl.handle.net/1959.13/28897
- Near-field scanning photocurrent measurements of polyfluorene blend devices: directly correlating morphology with current generation
McNeill, Christopher R.;
Holdsworth, John L.;
Dastoor, Paul C.
- Near-field scanning photocurrent microscopy (NSPM) measurements probing the relationship between morphology and current generation in photovoltaic devices based on p-xylene processed poly(9,9'-dioctylfluorene-co-bis-N,N'-(4,butylphenyl)-bis-N,N'-phenyl-1,4-phenylene-diamine) [PFB] and poly(9,9'-dioctylfluorene-co-benzo-thiadiazole) [F8BT] blend films are presented. We find that current generation occurs primarily from within the micron-sized phase-segregated domains, with the PFB-rich phase contributing significantly more current than the surrounding F8BT-rich regions. These results are explained by nanoscale intermixing within the micron-sized domains, with differing extents of intermixing in the PFB- and F8BT-rich domains.
- Nano Letters Vol. 4, Issue 12, p. 2503-2507
- Publisher Link
- American Chemical Society
near-field scanning photocurrent microscopy;
micron-sized phase-segregated domains
- Resource Type
- journal article