Please use this identifier to cite or link to this item: http://hdl.handle.net/1959.13/933525
- Title
- Dual actuation for high speed atomic force microscopy
- Author/Creator
-
Kuiper, S.;
Fleming, A. J.;
Schitter, G.
- Institution
- The University of Newcastle. Faculty of Engineering & Built Environment, School of Electrical Engineering and Computer Science
- Description
- In atomic force microscopy (AFM) the imaging speed is strongly limited by the bandwidth of the feedback loop that controls the interaction between the measurement tip and the sample. A significant increase in closed-loop bandwidth can be achieved by combining a long-range, low-bandwidth actuator with a short-range, high-bandwidth actuator, forming a dual actuated system. This contribution discusses the design of a model-based feedback controller that controls the tip-sample interaction in dual actuated AFM. In order to guarantee closed-loop stability, the dynamic uncertainties of the system are identified and taken into account in the controller design. Two different design cases are discussed, showing the trade-off between the positioning range at lower frequencies and the positioning range at higher frequencies. The designed feedback controller is implemented on the prototype AFM system and demonstrates a disturbance rejection bandwidth of 20 kHz.
- Relation
- 5th IFAC Symposium on Mechatronic Systems. Proceedings of the 5th IFAC Symposium on Mechatronic Systems (Cambridge, MA September 13-15, 2010) p. 220-226
- Publisher Link
- http://dx.doi.org/10.3182/20100913-3-US-2015.00105
- Date
- 2010
- Publisher
- International Federation of Automatic Control (IFAC)
- Keyword(s)
-
atomic force microscopy;
model-based control;
piezoelectric actuator;
dual actuation
- Resource Type
- conference paper
- Identifier
- http://hdl.handle.net/1959.13/933525
- Identifier
- ISBN:9783902661760
- Identifier
- ISSN:1474 3370
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