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Please use this identifier to cite or link to this item: http://hdl.handle.net/1959.13/933211
- Spiral-scan atomic force microscopy: a constant linear velocity approach
Mahmood, Iskandar A.;
Moheimani, S. O. Reza
- The University of Newcastle. Faculty of Engineering & Built Environment, School of Electrical Engineering and Computer Science
- This paper describes an alternative method to the widely-used raster-scan technique for Atomic Force Microscopy (AFM). In this method, the sample is scanned in a spiral pattern instead of the well established raster trajectory. A spiral pattern is produced by applying cosine and sine signals with slowly varying amplitudes to the x-axis and y-axis of an AFM scanner respectively. In order to ensure that the spiral trajectory travels at a constant linear velocity (CLV), frequency and amplitude of the input signals are varied simultaneously in a way that the linear velocity of the scanner is kept constant. Experimental results obtained by implementing the CLV spiral scan on a commercial AFM indicate that, compared with the raster-scan method, high-quality AFM images of equal area and pitch can be generated two times faster and using half of the total traveled distance.
- 10th IEEE International Conference on Nanotechnology, Joint Symposium with Nano Korea 2010 (IEEE-NANO). Proceedings of the 10th IEEE International Conference on Nanotechnology, Joint Symposium with Nano Korea (Seoul, Korea 17-20 August, 2010) p. 115-120
- Publisher Link
- Institute of Electrical and Electronics Engineers (IEEE)
atomic force microscopy;
- Resource Type
- conference paper
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