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Please use this identifier to cite or link to this item: http://hdl.handle.net/1959.13/932901

Title
Atomic force microscopy with a 12-electrode piezoelectric tube scanner
Author/Creator
Yong, Yuen K.;  Ahmed, Bilal;  Moheimani, S. O. Reza
Institution
The University of Newcastle. Faculty of Engineering & Built Environment, School of Electrical Engineering and Computer Science
Description
This paper presents a piezoelectric tube scanner with a novel electrode pattern and describes how it may be used for simultaneous sensing and actuation. The electrodes are arranged such that the tube is driven in an antisymmetrical manner, resulting in a collocated system suitable for positive position feedback (PPF). A PPF controller is designed to damp the scanner’s resonance. Piezoelectric strain-induced voltage is used as measurement. The device is then installed into an atomic force microscope to obtain open- and closed-loop images of a grating at 10, 15.6, and 31 Hz scan rates. The closed-loop images are noticeably superior to the open-loop images, illustrating the effectiveness of the proposed scanner when used simultaneously as a sensor and an actuator.
Relation
Review of Scientific Instruments Vol. 81, Issue 3
Publisher Link
http://dx.doi.org/10.1063/1.3314901
Date
2010
Publisher
American Institute of Physics
Keyword(s)
atomic force microscopy;  piezoelectric devices;  high-speed AFMs;  scanning systems
Resource Type
journal article
Rights
© American Institute of Physics
Identifier
http://hdl.handle.net/1959.13/932901
Identifier
ISSN:0034-6748
Reviewed
Reviewed
Full Text
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Subject
"Review of Scientific Instruments"
 
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